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EM-Tec Multi and Combination SEM Standards



                                                                             
EM-Tec Multi and Combination SEM Standards
    31-023404 EM-Tec M4-4 combi standard with Sn on C + Au on C + hi-res Au
    on C + M-10 silicon grid
Introduction

The EM-Tec multi and combination standards offer up to 3 SEM test specimes and the M-10 silicon chip with 10µm calibration pattern on a single SEM specimen stub. The combination of different standards allows for moving quickly from one standard to the next. The multi SEM standards are ideal for a multi instrument environment and to quickly assess the performance of the SEM. The combination standard with tin spheres on a 10µm silicon grid are ideal for tabletop SEMs.


Available EM-Tec multi and combination SEM standards

The 4 different standards used for the EM-Tec multi and combination SEM standards are:


Configuration of the 6 different EM-Tec multi standards

 

 

Resolution test standards

Calibration standard

Product #

Style

Au on C

Hi-res Au on C

Sn on C

M-10 10µm grid

31-023102

EM-Tec M1-2

Yes

Yes

 

 

31-023202

EM-Tec M2-2

Yes

 

Yes

 

31-023303

EM-Tec M3-3

Yes

Yes

Yes

 

31-023404

EM-Tec M4-4

Yes

Yes

Yes

Yes

31-023502

EM-Tec M5-3

Yes

 

Yes

Yes

31-023602

EM-Tec M6-2

 

 

Yes

Yes

The EM-Tec multi and combination SEM standards are offered on a standard Ø12.7mm pin stub, the Ø12.2mm (12.5mm) JEOL cylinder stub or the Ø15mm Hitachi M4 cylinder stub.

Full list of available specimen mounts for calibration standards and test specimens


Ordering Information

*Prices are without tax. Tax might be added in cart.


    # 31-023102   EM-Tec M1-2 combi standard with Au on C + high-resolution Au on C

EM-Tec M1-2 combi standard with Au on C + high-resolution Au on C EM-Tec M1-2 dual combination standard with gold on carbon 1 (5-200nm gold particles) and high resolution gold on carbon 3 (3-50nm gold particles). Suitable for checking resolution and grey levels on standard SEMs and FESEMs at higher magnifications.

EM-Tec M1-2 combi standard with Au on C + high-resolution Au on C
Product # Unit Price* Add to Quote / Cart
31-023102-1 EM-Tec M1-2 with Au on C + hi-res Au on C, standard 12.7mm pin stub
Qty:

each €275,95
31-023102-6 EM-Tec M1-2 with Au on C + hi-res Au on C, 12.2mm JEOL stub
Qty:

each €275,95
31-023102-8 EM-Tec M1-2 with Au on C + hi-res Au on C, 15mm Hitachi M4 stub
Qty:

each €275,95


    # 31-023202   EM-Tec M2-2 combi standard with Sn on C + Au on C

EM-Tec M2-2 combi standard with Sn on C + Au on C EM-Tec M2-2 dual combination standard with tin on carbon 6 (5nm-30m Sn particles) and gold on carbon 1 (5-200nm gold particles). Suitable for checking astigmatism, resolution and grey levels on table top SEMs and on standard SEMs from medium to high magnifications.

EM-Tec M2-2 combi standard with Sn on C + Au on C
Product # Unit Price* Add to Quote / Cart
31-023202-1 EM-Tec M2-2 with Sn on C + Au on C, standard 12.7mm pin stub
Qty:

each €185,50
31-023202-6 EM-Tec M2-2 with Sn on C + Au on C, 12.2mm JEOL stub
Qty:

each €185,50
31-023202-8 EM-Tec M2-2 with Sn on C + Au on C, 15mm Hitachi M4 stub
Qty:

each €185,50


    # 31-023303   EM-Tec M3-3 combi standard with Sn on C + Au on C + hires Au on C

EM-Tec M3-3 combi standard with Sn on C + Au on C +  hires Au on C EM-Tec M2-3 triple combination standard with tin on carbon 6 (5nm-30m Sn particles), gold on carbon 1 (5-200nm gold particles) and hires gold on carbon 6 (3-50nm gold particles). Suitable for checking astigmatism, resolution and grey levels on standard SEMs and FESEMs from medium to high magnifications.

EM-Tec M3-3 combi standard with Sn on C + Au on C + hires Au on C
Product # Unit Price* Add to Quote / Cart
31-023303-1 EM-Tec M3-3 with Sn on C + Au on C + hi-res Au on C, standard 12.7mm pin stub
Qty:

each €364,50
31-023303-6 EM-Tec M3-3 with Sn on C + Au on C + hi-res Au on C, 12.2mm JEOL stub
Qty:

each €364,50
31-023303-8 EM-Tec M3-3 with Sn on C + Au on C + hi-res Au on C, 15mm Hitachi M4 stub
Qty:

each €364,50


    # 31-023404   EM-Tec M4-4 combi standard with Sn on C + Au on C + hi-res Au on C + M-10 silicon grid

EM-Tec M4-4 combi standard with Sn on C + Au on C + hi-res Au on C + M-10 silicon grid EM-Tec M3-4 quad combination standard with tin on carbon 6 (5nm-30m Sn particles), gold on carbon 1 (5-200nm gold particles), high resolution gold on carbon 6 (3-50nm gold particles) and the EM-Tec M-10 silicon grid. Suitable for checking astigmatism, resolution and grey levels from low to very high maginfications and for medium magnification calibration on standard SEMs and FESEMs.

EM-Tec M4-4 combi standard with Sn on C + Au on C + hi-res Au on C + M-10 silicon grid
Product # Unit Price* Add to Quote / Cart
31-023404-1 EM-Tec M4-4 with Sn on C + Au on C+ hi-res Au on C + M-10 silicon grid, standard 12.7mm pin stub
Qty:

each €414,75
31-023404-6 EM-Tec M4-4 with Sn on C + Au on C+ hi-res Au on C + M-10 silicon grid, 12.2mm JEOL stub
Qty:

each €414,75
31-023404-8 EM-Tec M4-4 with Sn on C + Au on C+ hi-res Au on C + M-10 silicon grid, 15mm Hitachi M4 stub
Qty:

each €414,75


    # 31-023503   EM-Tec M5-3 combi standard with Sn on C + Au on C + M-10 silicon grid

EM-Tec M5-3 combi standard with Sn on C + Au on C + M-10 silicon grid EM-Tec M5-3 triple combination standard with tin on carbon 6 (5nm-30m Sn particles), gold on carbon 1 (5-200nm gold particles) and the EM-Tec M-10 silicon grid. Suitable for checking astigmatism, resolution and grey levels from low to high magnifications and for medium magnification calibration on standard SEMs and table top SEMs.

EM-Tec M5-3 combi standard with Sn on C + Au on C + M-10 silicon grid
Product # Unit Price* Add to Quote / Cart
31-023503-1 EM-Tec M5-3 with Sn on C + Au on C + M-10 silicon grid, standard 12.7mm pin stub
Qty:

each €256,75
31-023503-6 EM-Tec M5-3 with Sn on C + Au on C + M-10 silicon grid, 12.2mm JEOL stub
Qty:

each €256,75
31-023503-8 EM-Tec M5-3 with Sn on C + Au on C + M-10 silicon grid, 15mm Hitachi M4 stub
Qty:

each €256,75


    # 31-023602   EM-Tec M6-2 combi standard with Tin spheres on the 10m silicon grid

EM-Tec M6-2 combi standard with Tin spheres on the 10m silicon grid EM-Tec M6-2 dual combination standard with tin spheres (5nm-30m) directly on the EM-Tec M10 with the 10m grid pattern in silicon. This combination standard is intended for checking resulution, grey levels and magnification at table top or benchtop SEMs or in the medium magnification range on standard SEMs.

EM-Tec M6-2 combi standard with Tin spheres on the 10m silicon grid
Product # Unit Price* Add to Quote / Cart
31-023602-1 EM-Tec M6-2 with Sn directly on M-10 silicon grid, standard 12.7mm pin stub
Qty:

each €212,75
31-023602-6 EM-Tec M6-2 with Sn directly on M-10 silicon grid, 12.2mm JEOL stub
Qty:

each €212,75
31-023602-8 EM-Tec M6-2 with Sn directly on M-10 silicon grid, 15mm Hitachi M4 stub
Qty:

each €212,75
31-023602-U EM-Tec M6-2 with Sn directly on M-10 silicon grid, unmounted
Qty:

each €208,75




SEM Supplies

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Calibration

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LM


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