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EM-Tec Au on C resolution standard 4, 2-30nm   
     EM-Tec Au on C resolution standard 4, 2-30nm

Gold on carbon resolution test standard with finer gold particles on a carbon substrate. The gold particles size ranges from 2-30nm. The carbon substrate is 6mm diameter with 2mm height. The finer gold provides excellent SE signal whereas the dark carbon background separates the individual gold particles. The finer gold particles are ideal for ultra high resolution testing on FESEMs. Use with a magnification of 100,000x or higher. Ideally suited to correct astigmatism and image shift and to adjust for correct focus, beam size, contrast and brightness for ultra high resolution imaging. This resolution standard has a square mesh grid pattern to facilitate locating and positioning.
Available unmounted or mounted on the most popular SEM stubs. If you work with multiple SEM platforms, look at our SEM stub adapter page. The SEM stub adapters enable you to use a single resolution standard on all SEMs.

Product # Unit Price* Add to quote / Cart
31-021400-U EM-Tec Au on C resolution standard 4, 2-30nm, unmounted

each €256,00
31-021400-1 EM-Tec Au on C resolution standard 4, 2-30nm, mounted on Ø12.7mm pin stub

each €266,00
31-021400-2 EM-Tec Au on C resolution standard 4, 2-30nm, mounted on Ø12.7mm Zeiss pin stub

each €266,00
31-021400-6 EM-Tec Au on C resolution standard 4, 2-30nm, mounted on Ø12.2mm JEOL stub

each €266,00
31-021400-8 EM-Tec Au on C resolution standard 4, 2-30nm, mounted on Ø15mm Hitachi stub

each €266,00
31-021400-10 EM-Tec Au on C resolution standard 4, 2-30nm, custom mount

each €356,00

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