EM-Tec CXS and RSX calibration and reference standards for
EDS, WDS, BSD, CL and Raman
compact & practical analytical standards


                                                                             
EM-Tec RXS-10PD peak deconvolution test standard, 10 materials plus F/C on pin stub
    EM-Tec RXS-10PD peak deconvolution test standard, 10 materials plus F/C on pin stub
 
Introduction

The EM-Tec CXS and RXS calibration and reference standards are designed for calibration, resolution testing and performance testing. Each standard contains a selection of reference materials, in the form of element or compounds, optimized for specific calibration tasks.They are available as compact Ø 12.7mm pin stubs and Ø25.4mm discs:

The elements/compounds are all mounted with a vacuum compatible epoxy. The mounts are then precision polished to ensure that all the elements/compounds are in the same plane. Virtually all standards include a Faraday cup to enable electron probe measurements and monitoring. The polished calibration standards are carbon coated to ensure conductivity and avoid charging.
The pin stub type standards are compatible with TFS, FEI, Philips, Zeiss, LEO, TESCAN, Phenom, Leica, Cambridge instrument and CamScan SEMs. For using the calibration standards on JEOL and Hitachi SEM, please consult the page with the EM-Tec SEM stub adapters.

The EM-Tec CSX and RSX calibration and reference standards are intended for calibration and testing of:
- SEM / EDS systems and/or SEM / WDS systems
- SEM back scattered electron detector (BSD)
- SEM / GSR (gunshot residue) analysis
- Electron Probe Micro-Analyser (EPMA) systems
- SEM particle analysis systems
- SEM cathode-luminescence (CL) detector
- SEM / Raman system
 -SEM / micro-XRF systems
- micro-XRF systems


Specifications of the EM-Tec CXS and RXS calibration and reference standards

Product #

Type

Calibration application description

Standards #

Far. cup

Size

36-000505

CXS-5F

Light elements, EDS detector

5

Yes

Ø12.7mm x pin

36-000506

CXS-5C

Light elements, EDS detector, Image

5

No

Ø12.7mm x pin

36-000508

CXS-5N

Light elements, EDS detector

5

Yes

Ø12.7mm x pin

36-000512

CXS-5LE

Light elements detection performance

5

Yes

Ø12.7mm x pin

36-000507

CXS-5BE

BSD, EDS detector

5

Yes

Ø12.7mm x pin

36-000522

CXS-6BE

BSD, EDS detector

6

Yes

Ø12.7mm x pin

36-000510

CXS-10BE

BSD, EDS detector, heavier elements

10

Yes

Ø12.7mm x pin

36-000511

CXS-10BEC2

BSD, EDS detector, lighter elements

10

Yes

Ø12.7mm x pin

36-000513

CXS-5TX

EDAX  TEX set-up

5

Yes

Ø12.7mm x pin

36-000514

CXS-5LX

EDAX LEX / TEX set-up

5

Yes

Ø12.7mm x pin

36-000517

CXS-6F

EDS detector & performance

6

Yes

Ø12.7mm x pin

36-000521

CXS-6LE

Light elements, EDS detector

6

Yes

Ø12.7mm x pin

36-000525

CXS-10GSR

GSR analysis, EDS detector

10

Yes

Ø12.7mm x pin

36-000618

RXS-18RE

Rare earth metals reference

18

Yes

Ø25.4 x 9mm

36-000621

RXS-21RE

Rare earth metals reference

21

Yes

Ø25.4 x 9mm

36-000636

RXS-36M

Metals reference

36

Yes

Ø25.4 x 9mm

36-000638

RXS-36MC

Metals & minerals reference

36

Yes

Ø25.4 x 9mm

36-000640

RXS-40MC

Mineral & compounds reference

40

Yes

Ø25.4mm x pin

36-000642

RXS-40MM

Metals & minerals reference

40

Yes

Ø25.4mm x pin

36-000644

RXS-40M+CL

Minerals & Cathode-luminescense reference

40

Yes

Ø25.4mm x pin

36-000707

RXS-7CL

Cathode-luminescence reference

7

Yes

Ø12.7mm x pin

36-000710

RXS-10PD

Peak deconvolution, resolution test

10

Yes

Ø12.7mm x pin

36-000711

RXS-10RA

Raman performance

10

Yes

Ø12.7mm x pin

36-000712

RXC-2WSi

Fusion, BSD/X-ray contrast & resolution

2

No

Ø12.7mm x pin

36-000714

RXC-2TaSi

Fusion, BSD/X-ray contrast & resolution

2

No

Ø12.7mm x pin



Ordering Information for EM-Tec CXS calibration and reference standards for EDS, WDS and BSD

*Prices without VAT, but within the EU, we have to check for valid VAT-ID.
  
EM-Tec CXS-5F light element and EDS calibration standard, 5 materials plus F/C on pin stub
EM-Tec CXS-5F light element and EDS calibration standard, 5 materials plus F/C on pin stub
The EM-Tec CXS-5F calibration standard includes 5 reference materials and a 200µm aperture copper Faraday cup. All mounted in a compact Ø12.7mm standard aluminium pin stub. The copper Faraday cup and aluminium pin stub can serve as a Cu/Al reference for detector gain/zero calibration. Intended for: EDS detector performance, light element detection, EDS detector resolution, EDS detector calibration and quantitative analysis test.
Reference materials: Stainless steel AISI 316L, SiO2, Mn, B and C. 200µm copper Faraday cup.
Product # Unit Price* Add to Quote / Cart
36-000505 each €260,00
Qty:



EM-Tec CXS-5C light element and EDS calibration standard, 5 materials plus 200M TEM grid on pin stub
EM-Tec CXS-5C light element and EDS calibration standard, 5 materials plus 200M TEM grid on pin stub
The EM-Tec CXS-5C calibration standard includes 5 reference materials and a 200mesh copper grid All mounted in a compact Ø12.7mm standard aluminium pin stub. The 200mesh copper grid acts as an image size reference and with the aluminium pin stub it serves as a Cu/Al reference for detector gain/zero calibration. Intended for: EDS detector performance, light element detection, EDS detector resolution, EDS detector calibration and quantitative analysis test.
Reference materials: Stainless steel 316L, SiO2, Mn, B and C. 200mesh copper grid.
Product # Unit Price* Add to Quote / Cart
36-000506 each €260,00
Qty:



EM-Tec CXS-5N light element and EDS calibration standard, 5 materials plus F/C on pin stub
EM-Tec CXS-5N light element and EDS calibration standard, 5 materials plus F/C on pin stub
The EM-Tec CXS-5N calibration standard includes 5 reference materials and a 200µm aperture copper Faraday cup. All mounted in a compact Ø12.7mm standard aluminium pin stub. The copper Faraday cup and aluminium pin stub can serve as a Cu/Al reference for detector gain/zero calibration. Intended for: EDS detector performance, light element detection, EDS detector resolution, EDS detector calibration and quantitative analysis test. Similar to #36-00505; EM-Tec CXS-5F, but with BN instead of B to add N.
Reference materials: Stainless steel AISI 316L, SiO2, Mn, BN and C. 200µm copper Faraday cup.
Product # Unit Price* Add to Quote / Cart
36-000508 each €260,00
Qty:



EM-Tec CXS-5LE light element and EDS calibration standard, 5 materials plus F/C on pin stub
EM-Tec CXS-5LE light element and EDS calibration standard, 5 materials plus F/C on pin stub
The EM-Tec CXS-5LE calibration standard includes 5 reference materials and a 200µm aperture copper Faraday cup. All mounted in a compact Ø12.7mm standard aluminium pin stub. The copper Faraday cup and aluminium pin stub can serve as a Cu/Al reference for detector gain/zero calibration. Intended for: light element performance test and EDS detector setup; includes: B, C, N, O and F in stable compounds.
Reference materials: CaB6, SiC, CrN, Fe2O3 and CaF2. 200µm copper Faraday cup.
Product # Unit Price* Add to Quote / Cart
36-000512 each €660,00
Qty:



EM-Tec CXS-5BE BSD calibration standard, 5 materials plus F/C on pin stub
EM-Tec CXS-5BE BSD calibration standard, 5 materials plus F/C on pin stub
The EM-Tec CXS-5BE calibration standard includes 5 reference materials and a 200µm aperture copper Faraday cup. All mounted in a compact Ø12.7mm standard aluminium pin stub. The copper Faraday cup and aluminium pin stub can serve as a Cu/Al reference for detector gain/zero calibration. Intended for: Back Scattered Electron Detector setup and performance, GSR software calibration, EDS detector set-up.
Reference materials: Au, Nb, Ge, Si and C. 200µm copper Faraday cup.
Product # Unit Price* Add to Quote / Cart
36-000507 each €402,00
Qty:



EM-Tec CXS-6BE BSD calibration standard, materials plus F/C on pin stub
EM-Tec CXS-6BE BSD calibration standard,  materials plus F/C on pin stub
The EM-Tec CXS-6BE calibration standard includes 6 reference materials and a 200µm aperture copper Faraday cup. All mounted in a compact Ø12.7mm standard aluminium pin stub. The copper Faraday cup and aluminium pin stub can serve as a Cu/Al reference for detector gain/zero calibration. Intended for: Back Scattered Electron Detector setup and performance, GSR software calibration, EDS detector set-up.
Reference materials: Au, Rh, Ge, Co, Si and C. 200µm copper Faraday cup.
Product # Unit Price* Add to Quote / Cart
36-000522 each €520,00
Qty:



EM-Tec CXS-10BE BSD calibration standard, 10 materials plus F/C on pin stub
EM-Tec CXS-10BE BSD calibration standard, 10 materials plus F/C on pin stub
The EM-Tec CXS-10BE calibration standard includes 10 reference materials and a 200µm aperture copper Faraday cup. All mounted in a compact Ø12.7mm standard aluminium pin stub. The copper Faraday cup and aluminium pin stub can serve as a Cu/Al reference for detector gain/zero calibration. Intended for: Back Scattered Electron Detector setup and performance, GSR software calibration, EDS detector set-up.
Reference materials: Bi, Ir, Ho, Sn, Nb, Ge, Co, Ti, Si and C. 200µm copper Faraday cup.
Product # Unit Price* Add to Quote / Cart
36-000510 each €687,50
Qty:



EM-Tec CXS-10BEC2 BSD calibration standard, 10 materials plus F/C on pin stub
EM-Tec CXS-10BEC2 BSD calibration standard, 10 materials plus F/C on pin stub
The EM-Tec CXS-10BEC2 calibration standard includes 10 reference materials and a 200µm aperture copper Faraday cup. All mounted in a compact Ø12.7mm standard aluminium pin stub. The copper Faraday cup and aluminium pin stub can serve as a Cu/Al reference for detector gain/zero calibration. Intended for: Back Scattered Electron Detector setup and performance including light elements , EDS detector set-up.
Reference materials: C, SiO2, Mo, Cu, BN, Fe, Ti, Sn, Ni and Al. 200µm copper Faraday cup.
Product # Unit Price* Add to Quote / Cart
36-000511 each €650,00
Qty:



EM-Tec CXS-5TX EDAX TEX calibration standard, 5 materials plus F/C on pin stub
EM-Tec CXS-5TX EDAX TEX calibration standard, 5 materials plus F/C on pin stub
The EM-Tec CXS-5TX calibration standard includes 5 reference materials and a 200µm aperture copper Faraday cup. All mounted in a compact Ø12.7mm standard stainless steel pin stub. The copper Faraday cup can be used to measure beam current and to monitor beam stability. Intended for: setting up EDAX detectors and EDS systems for 1-20KeV.
Reference materials: Si, Cr, Fe, Ni and Mo. 200µm copper Faraday cup.
Product # Unit Price* Add to Quote / Cart
36-000513 each €367,00
Qty:



EM-Tec CXS-5LX EDAX LEX/TEX calibration standard, 5 materials plus F/C on pin stub
EM-Tec CXS-5LX EDAX LEX/TEX calibration standard, 5 materials plus F/C on pin stub
The EM-Tec CXS-5LX calibration standard includes 5 reference materials and a 200µm aperture copper Faraday cup. All mounted in a compact Ø12.7mm standard aluminium pin stub. The copper Faraday cup and aluminium pin stub can serve as a Cu/Al reference for detector gain/zero calibration. Intended for: setting up EDAX detectors and EDS systems including light elelements.
Reference materials: Mo, Cu, SiO2, BN and C. 200µm copper Faraday cup.
Product # Unit Price* Add to Quote / Cart
36-000514 each €480,00
Qty:



EM-Tec CXS-6F light element and EDS calibration standard, 6 materials plus F/C on pin stub
EM-Tec CXS-6F light element and EDS calibration standard, 6 materials plus F/C on pin stub
The EM-Tec CXS-6F calibration standard includes 6 reference materials and a 200µm aperture copper Faraday cup. All mounted in a compact Ø12.7mm standard aluminium pin stub. The copper Faraday cup and aluminium pin stub can serve as a Cu/Al reference for detector gain/zero calibration. Intended for: EDS detector performance, light element detection, EDS detector resolution and EDS detector calibration.
Reference materials: Cu, Mn, Ti, CaCO3, B and C. 200µm copper Faraday cup.
Product # Unit Price* Add to Quote / Cart
36-000517 each €520,00
Qty:



EM-Tec CXS-6LE light element and EDS calibration standard, 6 materials plus F/C on pin stub
EM-Tec CXS-6LE light element and EDS calibration standard, 6 materials plus F/C on pin stub
The EM-Tec CXS-6LE calibration standard includes 6 reference materials and a 200µm aperture copper Faraday cup. All mounted in a compact Ø12.7mm standard aluminium pin stub. The copper Faraday cup and aluminium pin stub can serve as a Cu/Al reference for detector gain/zero calibration. Intended for: EDS detector performance, light element detection, EDS detector resolution, EDS detector calibration and quantitative analysis test.
Reference materials: Stainless steel 316, Mn, Ti, CaCO3, PFTE and BN. 200µm copper Faraday cup.
Product # Unit Price* Add to Quote / Cart
36-000521 each €480,00
Qty:



EM-Tec CXS-10GSR EDS/GSR calibration standard, 10 materials plus F/C on pin stub
EM-Tec CXS-10GSR EDS/GSR calibration standard, 10 materials plus F/C on pin stub
The EM-Tec CXS-10GSR calibration standard includes 10 reference materials and a 200µm aperture copper Faraday cup. All mounted in a compact Ø12.7mm standard aluminium pin stub. The copper Faraday cup and aluminium pin stub can serve as a Cu/Al reference for detector gain/zero calibration. Sb, Ba and Pb are supplied in a stable form. Intended for: GSR software calibration, EDS detector set-up, EDS peak calibration and BSD detector set-up
Reference materials: C, Si, Mn, Co, SrF2, Rh, Sb, BaSO4, PbCO3 and SRM 1155 (AISI 316). 200µm copper Faraday cup.
Product # Unit Price* Add to Quote / Cart
36-000525 each €750,00
Qty:



EM-Tec RXS-18RE rare earth reference standard, 18 materials plus F/C on stainless steel Ø25.4 x 9 mm disc
EM-Tec RXS-18RE rare earth reference standard, 18 materials plus F/C on stainless steel Ø25.4 x 9 mm disc
The EM-Tec RXS-18RE reference standard includes 18 reference rare earth elements and a 200µm aperture copper Faraday cup. All mounted in a Ø25.4 x 9 mm AISI 303 stainless steel disc. Intended as reference standard for quantitative EDS and WDS micro-analysis applications.
Reference materials: LaF3, CeO2, Pr, Nd, Sm, EuF3, Gd, Tb, Dy, Ho, Er, Tm, Yb, Lu, Sc, Y, U and C. 200µm copper Faraday cup. Sensitive to air, preferably stored under vacuum or inert gas.
Product # Unit Price* Add to Quote / Cart
36-000618 each €1875,00
Qty:



EM-Tec RXS-21RE rare earth reference standard, 21 materials plus F/C on stainless steel disc, Ø25.4 x 9 mm
EM-Tec RXS-21RE rare earth reference standard, 21 materials plus F/C on stainless steel disc, Ø25.4 x 9 mm
The EM-Tec RXS-21RE reference standard includes 21 reference rare earth elements and a 200µm aperture copper Faraday cup. All mounted in a Ø25.4 x 9 mm AISI 303 disc. Intended as reference standard for quantitative EDS and WDS micro-analysis applications.
Reference materials: LaF3, CeO2, PrSi2, NdSi2, Sm, EuF3, Gd, Tb, Dy, Ho, Er, Tm, Yb, Lu, Gd3Ga5O12, Sc, Y, U, ThF4, B and C. 200µm copper Faraday cup. Preferably stored under vacuum or inert gas.
Product # Unit Price* Add to Quote / Cart
36-000621 each €2125,00
Qty:



EM-Tec RXS-36M metals reference standard, 36 metals plus F/C on stainless steel disc, Ø25.4 x 9 mm
EM-Tec RXS-36M metals reference standard, 36 metals plus F/C on stainless steel disc, Ø25.4 x 9 mm
The EM-Tec RXS-36M metals reference standard includes 36 reference metal standards and a 200µm aperture copper Faraday cup. All mounted in a Ø25.4 x 9 mm AISI 303 stainless steel disc. Intended as reference standard for quantitative EDS and WDS micro-analysis applications.
Reference materials: Be, C, Al, Si, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Ge, Se, Sc, Y, Zr, Mo, Nb, Sn, Sb, Ru, Rh, Pd, Ag, PbTe, Hf, Ta, W, Re, Os, Ir, Au, Bi, and Pt. 200µm copper Faraday cup.
Product # Unit Price* Add to Quote / Cart
36-000636 each €1690,00
Qty:



EM-Tec RXS-36MC metals reference standard, 36 metals/compounds plus F/C on stainless steel disc, Ø25.4 x 9 mm
EM-Tec RXS-36MC metals reference standard, 36 metals/compounds plus F/C on stainless steel disc, Ø25.4 x 9 mm
The EM-Tec RXS-36MC materials reference standard includes 38 reference metal/compound standards and a 200µm aperture copper Faraday cup. All mounted in a Ø25.4 x 9 mm AISI 303 stainless steel disc. Intended as reference standard for quantitative EDS and WDS micro-analysis applications. Carbon coated to ensure conductivity.
Reference materials: B, C, MgO, Al2O3, Si, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, GaP, SrF2, Zr, Nb, Mo, Pd, Ag, Cd, InP/ GaAs, Sn, Sb, BaF2, Hf/Ta, W, Pt, Au, PbTe and Bi. 200µm copper Faraday cup. Compounds are:

Albite NaAlSi3O8
Orthoclase KAlSi3O8
Wollastonite CaSiO3
Pyrite FeS2
Product # Unit Price* Add to Quote / Cart
36-000638 each €1800,00
Qty:



EM-Tec RXS-40MC mineral reference standard, 40 minerals plus F/C on stainless steel Ø 25.4 mm pin stub
EM-Tec RXS-40MC mineral reference standard, 40 minerals plus F/C on stainless steel Ø 25.4 mm pin stub
The EM-Tec RXS-40MC minerals reference standard includes 40 reference minerals and a 200µm aperture copper Faraday cup. All mounted in a Ø25.4 mm pin stub, made from AISI 303 stainless steel. This standard is carbon coated for conductivity. The stoichiometric compositions of these natural minerals are nominal; other impurities or small inclusions may be present. Intended as reference standard for quantitative EDS and WDS micro-analysis applications. 200µm copper Faraday cup and 40 minerals:

  

  

 

 1 Albite A NaALSi3O8  21 Magnetite Fe3O4
 2 Albite B NaALSi3O8  22 Cuprite Cu2O
 3 Pyrite FeS2  23 Chrysoberyl (synthetic) Be3Al2O4
 4 Marcasite FeS2  24 Wulfenite PbMoO4
 5 Wurtzite (Zn, Fe)S  25 Cerrusite PbCO3
 6 Siderite FECO3  26 Vanadinite [Pb(VO4)3]Cl
 7 Marmarite (Zn, Fe)S  27 Apatite Ca5(PO4)3(F,Cl,OH)
 8 Aragonite CaCO3  28 Casserite SnO2
 9 Calcite CaCO3  29 Celestite SrSO4
 10 Barytes BaSO4  30 Rutile TiO2
 11 Benitoite BaTiSi3O9  31 Anastase TiO2
 12 Fluorite CaF2  32 Brookite TiO2
 13 Dolomite (CaMg)(CO3)2  33 Gypsum CaSO4.2H2O
 14 YAG (synthetic) Y3Al5O12  34 Baddeleyite ZrO2
 15 Perovskite CaTiO3  35 Zirconia (synthetic) ZrO2 (8 mole% Y2O3)
 16 Sphene CaTiSiO5  36 Beryl (Be3Al2(SiO3)6)
 17 Scheelite  37 Adularia (KAlSiO3O8)
 18 Tausonite (synthetic) SrTiO3  38 Quartz SiO2
 19 Enargite Cu3AsS4  39 Spinel (synthetic) MgAl2O4
 20 Haemetite Fe2O3  40 Corundum Al2O3

Product # Unit Price* Add to Quote / Cart
36-000640 each €1950,00
Qty:



EM-Tec RXS-40MM metals & mineral reference standard, 40 standards plus F/C on stainless steel Ø 25.4 mm pin stub
EM-Tec RXS-40MM metals & mineral reference standard, 40 standards plus F/C on stainless steel Ø 25.4 mm pin stub
The EM-Tec RXS-40MM metals & minerals reference standard includes 40 standards and a 200µm aperture copper Faraday cup. The standards are: 27 reference metals, 5 compounds and 8 minerals. All mounted in a Ø25.4 mm standard pin stub, made from AISI 303 stainless steel. The standard is carbon coated for conductivity. The stoichiometric compositions of the natural minerals are nominal; other impurities may be present. Intended as reference standard for quantitative EDS and WDS micro-analysis applications with the following elements: Ag, Al, As, Au, Ba, Bi, Ca, Ce, Cl, Co, Cr, Cu, F, Fe, Ga, Ge, Hf, In, K, Mg, Mn, Mo, Na, Nb, Ni, O, P, Pb, Pt, Re, Rh, S, Sb, Se, Si, Sn, Ta, Te, Ti, V, W, Y, Zn, Zr
The EM-Tec RXS-40MM includes 27 single elements, 5 compounds & 8 minerals:

CaF2
CeO2
GaAs
InP
PbTe
28 Baryte BaSO4
29 Pyromorphite Pb5(PO4)3Cl
31 Haemetite Fe2O3
32 Pyrite FeS2
35 Adularia KAl2Si3O8
36 Spinel (synthetic) MgAl2O3
37 YAG (synthetic) Y3Al5O12
39 Albite NaALSi3O8

Product # Unit Price* Add to Quote / Cart
36-000642 each €2065,00
Qty:



EM-Tec RXS-40MC+CL mineral + cathode luminescence reference standard, 40 minerals plus F/C on stainless steel pin stub, Ø25.4 mm
EM-Tec RXS-40MC+CL  mineral + cathode luminescence reference standard, 40 minerals plus F/C on stainless steel pin stub, Ø25.4 mm
The EM-Tec RXS-40MC+CL minerals reference standard includes 40 reference minerals and a 200µm aperture copper Faraday cup. EDS spectra, cathode luminescence spectra and quantitative EDS analysis results are provided for each mineral. All minerals are mounted in a Ø25.4 mm pin stub, made from AISI 303 stainless steel. The standard is coated coated for conductivity. The stoichiometric compositions of these natural minerals are nominal; other impurities or small inclusions may be present. Intended as reference standard for CL set-up and test, quantitative EDS and WDS micro-analysis applications. 200µm copper Faraday cup and 40 minerals:

  

 1 Albite A NaALSi3O8  21 Strontium titanite SrTiO3
 2 Anhydrite CaSO4  22 LaF3
 3 Anorthite CalAl2Si2O8  23 Pezzottaite Cs(Be2Li)Al2Si6O18
 4 Apatite Ca5(PO4)3  24 ThF4
 5 Aragonite CaCO3  25 MgO
 6 Baddeleyite ZrO2  26 Pyromorphite Pb5(PO4)3Cl
 7 Barite BaSO4  27 Quartz SiO2
 8 Benitoite BaTiSi3O9  28 Scheelite CaWO4
 9 Beryl Be3Al2(SiO3)6  29 Sodalite Na8(Al6Si6O24)Cl2
 10 Calcite CaCO3  30 Spinel MgAl2O4
 11 Cassiterite SnO2  31 Spodumene LiAl(SiO3)2
 12 Celestine SrSO4  32 Strontionite SrCO3
 13 Crysoberyl BeAl2O4  33 Sphene CaTiSiO5
 14 Corundum Al2O3  34 Wollastonite CaSiO3
 15 Kutnohorite Ca(Mn)(CO3)2  35 YAG (synthetic) Y3Al5O12
 16 Diopside CaMgSi2O6  36 Zircon ZrSiO4
 17 Dolomite (CaMg)(CO3)2  37 Zirconia (ZrO2 + 10% Y2O3
 18 Feldspar KAlSi3O8  38 CdS
 19 Fluorite CaF2  39 SrF2
 20 Hambergite Be2BO3(OH)  40 ZnS

Product # Unit Price* Add to Quote / Cart
36-000644 each €3685,00
Qty:



EM-Tec RXS-10PD peak deconvolution test standard, 10 materials plus F/C on pin stub
EM-Tec RXS-10PD peak deconvolution test standard, 10 materials plus F/C on pin stub
The EM-Tec RXS-10PD peak deconvolution test standard includes 10 reference compounds and a 200µm aperture copper Faraday cup. All mounted in a compact Ø12.7mm standard aluminium pin stub. Intended for testing EDS and WDS spectrometer performance and as reference with overlapping materials.
Reference materials: Molybdenite (MoS2), Zinkenite (Pb9Sb22S42), Galena (PbS), Cinnabar (HgS), Wulfrenite (PbMoO4), Benitoite (BaTiSiO9), Galkhaite ((Cs,Tl)(Hg, Cu, Zn)6(As)4S12+trace Sb, Kleinite (Hg2N(ClSO4).n(H2O), Kosnarite (KZr(PO)3) and Enargite (Cu3AsS4). 200µm copper Faraday cup.
Product # Unit Price* Add to Quote / Cart
36-000710 each €687,50
Qty:



EM-Tec RXS-7CL cathode-luminescence test standard, 7 materials on pin stub
EM-Tec RXS-7CL cathode-luminescence test standard, 7 materials on pin stub
The EM-Tec RXS-7CL test standard includes 7 reference compounds. All mounted in a compact Ø12.7mm standard aluminium pin stub. Intended for testing cathode-luminescence detector and spectrometer performance.
Reference materials: Benitoite, Chrysoberyl, Apatite, Fluorite, Spinel, Calcite and Corundum.
Product # Unit Price* Add to Quote / Cart
36-000707 each €500,00
Qty:



EM-Tec RXS-10RA Raman mineral analysis test standard, 10 materials plus F/C on pin stub
EM-Tec RXS-10RA Raman mineral analysis test standard, 10 materials plus F/C on pin stub
The EM-Tec RXS-10RA reference standard includes 10 reference compounds and a 200µm aperture copper Faraday cup. All mounted in a compact Ø12.7mm standard aluminium pin stub. Intended for performance testing for Raman mineral analysis.
Reference materials: Silica, Quartz, Aragonite, Calcite, Chalcedony, Pyrite, Marcasite, Rutile, Anastase and Brookite. 200µm copper Faraday cup.
Product # Unit Price* Add to Quote / Cart
36-000711 each €687,50
Qty:



EM-Tec RXS-2WSi resolution and contrast test standard, fused W/Si on pin stub
EM-Tec RXS-2WSi resolution and contrast test standard, fused W/Si on pin stub
The EM-Tec RXS-2WSi contrast test standard includes fused W and Si. Mounted in a compact Ø12.7mm standard aluminium pin stub. Intended for resolution and X-ray versus Z-contrast testing and optimizing of SEM/EDS or SEM/WDS parameters.
Reference materials: Fused W / Si
Product # Unit Price* Add to Quote / Cart
36-000712 each €290,00
Qty:



EM-Tec RXS-TaSi resolution and contrast test standard, fused Ta/Si on pin stub
EM-Tec RXS-TaSi resolution and contrast test standard, fused Ta/Si on pin stub
The EM-Tec RXS-2TaSi contrast test standard includes fused Ta and Si. Mounted in a compact Ø12.7mm standard aluminium pin stub. Intended for resolution and X-ray versus Z-contrast testing and optimizing of SEM/EDS or SEM/WDS parameters.
Reference materials: Fused Ta / Si.
Product # Unit Price* Add to Quote / Cart
36-000714 each €260,00
Qty:





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  TEM Grids
  TEM Support Films
  Silicon Nitride Films
  K-Kit Wet Cell Holder
  Graphene Films
  TEM Grid Boxes
  Cryo Grid Boxes
  TEM Sample Staining
  3mm Embedding Tubes
  Filaments/Cathodes
  Eyelash Manipulators

Cryo Supplies

  Cryo Grid Boxes
  Other Cryo Supplies

FIB Supplies

  FIB Lift-out Grids
  FIB Low Profile Stubs
  FIB Grid Holders
  FIB Pre-tilt Holders
  FIB Pre-tilt stubs
  FIB Grid Boxes
  SEM / FIB Magn. Calib.
  SEM Res. Test Spec.
  EDS / WDS Calibration
  TEM Calibration
  AFM / SPM Calibration
  LM Magn. Calibration

Vacuum Supplies

  Vacuum Gauges
  KF/NW Vacuum Parts
  KF/NW Vacuum Hoses
  Vacuum Oil and Grease
  Vacuum Sealant
  Diaphragm Pump
  Rotary vacuum Pump
  Vacuum Sample Storage
  Vacuum Pick-Up Pens

Sample Coating Supplies

  Sputter Targets
  Carbon Rods & Fibers
  Quartz QCM Crystals
  SEM Sample Coating Fluid

Evaporation Supplies

  Thermal Evaporation Sources
  Evaporation Materials
  Supports & Substrates
  SEM Preparation Stands
  Tweezers
  Probes & Picks
  Applicators & Swabs
  Plastic Transfer Pipettes
  Cutting Tools / Scissors
  Conductive Paint/Cement
  Conductive Tapes & Tabs
  Non-Conductive Adhesives
  Sample Storage
  Hand Tools
  Sorting Wire Mesh
  Preparation Surfaces
  Cleaning / Gloves
  Conductive Metal Powders
  Metallographic Sample Prep
  AFM/SPM Discs
  AFM/SPM Disc Pick-up Tool
  AFM/SPM Holders
  AFM/SPM Disc Storage
  Cantilever Tweezers
  AFM/SPM Discs Tweezers
  Nano-Tec Mica Discs
  HOPG Substrates

Light Microscopy

  Correlative Cover Slips
  Glass Microscope Slides
  Glass Cover Slips
  Quartz Microscope Slides
  Quartz Cover Slips
  Black Metal Slides
  Slide Storage Boxes
  LM Calibration
  Plastic Transfer Pipettes
  Optical Lens Tissue
  Glass Petri Dishes
  PTFE Beakers