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Micro-Tec Individual Graticule Calibration Standards
ideal for low magnifications, large areas, microscope stages and digital imaging systems



Introduction
    31-T33200   CCS-5 5mm cross scale, 0.01mm div., Si/Cr, opaque
CCS-5 5mm cross scale, 0.01mm div., Si/Cr, opaque

The new and innovative Micro-Tec individual graticule calibration standards have been designed using an ultra-flat conductive silicon substrate with corrosion resistant Cr lines. They are manufactured utilizing the latest semiconductor manufacturing techniques. The Micro-Tec graticule calibration standards provide high contrast images for ease of calibration. Each of the calibration standards has a unique product ID and serial number etched on the die. Each of the Micro-Tec graticule calibration standard is fully NIST traceable and are supplied with a certificate of traceability.  The Micro-Tec graticule calibration standards are ideally suited for:

  • reflective light microscopes
  • stereo microscopes
  • optical magnifiers
  • low magnification SEM
  • digital imaging systems
  • quality control measurements

The Micro-Tec family of silicon based graticules for bright-field applications consists of:

  • CCS-1       1mm cross scale pattern with 0.01mm divisions
  • CCS-5       5mm cross scale pattern with 0.01mm divisions
  • CCS-10    10mm cross scale pattern with 0.01mm divisions
  • LCS-10     10mm compound linear scale with 1.0, 0.1 and 0.01mm divisions
  • CCS-2.5   1 inch cross scale pattern with 0.001inch divisions

The deposited Cr lines are in the same focus plane as the substrate, better defined and provide more signal than etched patterns. They are also less prone to accumulate dust particles in the patterns.

General specifications for  all Micro-Tec graticule standards:
Substrate  525µm thick boron doped ultra-flat wafer with <100> orientation
Conductive Excellent, 5-10 Ohm resistivity
Lines

75nm thick, 5.0µm wide pure Chromium lines

Identification Product ID with serial number etched
Mounting Unmounted standard
Supplied Supplied in a Gel-Pak box

Specifications for the individual Micro-Tec graticule calibration standards

Product #

Name

Pattern size

Units / Div

Die size

Traceable

Mounting

31-T33100

Micro-Tec CCS-1

1mm cross

0.01mm

3.5x3.5mm

Yes, NIST

Optional

31-T33200

Micro-Tec CCS-5

5mm cross

0.01mm

6.0x6.0mm

Yes, NIST

 

31-T33300

Micro-Tec CCS-10

10mm cross

0.01mm

12.0x12.0mm

Yes, NIST

 

31-T33400

Micro-Tec LCS-10

10mm long

1.0/0.1/0.01mm

6.0x12.0mm

Yes, NIST

 

31-T33500

Micro-Tec CCS-2.5

1 inch cross

0.001inch

3.5x3.5mm

Yes, NIST

 

 

An alternative calibration standard is the MTC-5 multiple target calibration standards with cross scale pattern, circles, squares and hexagons. Covers both magnification calibration and images distortion assessments. Available for both brightfield and darkfield applications.



Ordering Information

*Prices are without tax. Tax might be added in cart.


    # 31-T33100   CCS-1 Micro-Tec 1mm cross scale, 0.01mm div., Si/Cr, opaque

CCS-1 Micro-Tec 1mm cross scale, 0.01mm div., Si/Cr, opaque The Micro-Tec CCS-1 is a 1mm cross scale with 0.01mm divisions. 75nm thick bright chrome lines on conductive ultra-flat silicon substrate. Die size is 3.5 x 3.5mm. Each calibration standard has the product ID with an unique serial number etched in the standard.
Intended for reflected light microscopy, stereo microscopy, digital imaging systems and low magnification SEM applications. Example of Certificate of Traceability for Micro-Tec CCS-1.
(More images)

CCS-1 Micro-Tec 1mm cross scale, 0.01mm div., Si/Cr, opaque
Product # Unit Price* Add to Quote / Cart
31-T33100-U CCS-1 Micro-Tec 1mm cross scale, 0.01mm div., Si/Cr, opaque, unmounted
Qty:

each €49,50
31-T33100-11 CCS-1 Micro-Tec 1mm cross scale, 0.01mm div., Si/Cr, opaque, mounted on a black metal slide
Qty:

each €59,50
31-T33100-10 CCS-1 Micro-Tec 1mm cross scale, 0.01mm div., Si/Cr, opaque, custom mounted
Qty:

each €149,50



    # 31-T33200   CCS-5 Micro-Tec 5mm cross scale, 0.01mm div., Si/Cr, opaque

CCS-5 Micro-Tec 5mm cross scale, 0.01mm div., Si/Cr, opaque The Micro-Tec CCS-5 is a 5mm cross scale with 0.01mm divisions. 75nm thick bright chrome lines on conductive ultra-flat silicon substrate. Die size is 6x6mm. Each calibration standard has the product ID with an unique serial number etched in the standard.
Intended for reflected light microscopy, stereo microscopy, digital imaging systems and low magnification SEM applications. Example of Certificate of Traceability for Micro-Tec CCS-5.
(More images)

CCS-5 Micro-Tec 5mm cross scale, 0.01mm div., Si/Cr, opaque
More Info
Product # Unit Price* Add to Quote / Cart
31-T33200-U CCS-5 Micro-Tec 5mm cross scale, 0.01mm div., Si/Cr, opaque, unmounted
Qty:

each €97,50
31-T33200-11 CCS-5 Micro-Tec 5mm cross scale, 0.01mm div., Si/Cr, opaque, mounted on a black metal slide
Qty:

each €107,25
31-T33200-10 CCS-5 Micro-Tec 5mm cross scale, 0.01mm div., Si/Cr, opaque, custom mounted
Qty:

each €197,50


    # 31-T33300   CCS-10 Micro-Tec 10mm cross scale, 0.01mm div., Si/Cr, opaque

CCS-10 Micro-Tec 10mm cross scale, 0.01mm div., Si/Cr, opaque The Micro-Tec CCS-10 is a 10mm cross scale with 0.01mm divisions. 75nm thick bright chrome lines on conductive ultra-flat silicon substrate. Die size is 12x12mm. Each calibration standard has the product ID with an unique serial number etched in the standard.
Intended for reflected light microscopy, stereo microscopy, digital imaging systems and low magnification SEM applications. Example of Certificate of Traceability for Micro-Tec CCS-10.
(More images)

CCS-10 Micro-Tec 10mm cross scale, 0.01mm div., Si/Cr, opaque
More Info
Product # Unit Price* Add to Quote / Cart
31-T33300-U CCS-10 Micro-Tec 10mm cross scale, 0.01mm div., Si/Cr, opaque, unmounted
Qty:

each €179,50
31-T33300-11 CCS-10 Micro-Tec 10mm cross scale, 0.01mm div., Si/Cr, opaque, mounted on a black metal slide
Qty:

each €189,50
31-T33300-10 CCS-10 Micro-Tec 10mm cross scale, 0.01mm div., Si/Cr, opaque, custom mounted
Qty:

each €279,50


    # 31-T33400   LCS-10 Micro-Tec 10mm linear compound scale, 1, 0.1, 0.01mm div., Si/Cr, opaque

LCS-10 Micro-Tec 10mm linear compound scale, 1, 0.1, 0.01mm div., Si/Cr, opaque The Micro-Tec LCS-10 is a 10mm compound linear scale with 1.0, 0.1 and 0.01mm divisions. 0 to 9mm show divisons of 0.1mm, 9 to 10mm includes additional divisions of 0.01mm. 75nm thick bright chrome lines on conductive ultra-flat silicon substrate. Die size is 6x12mm. Each calibration standard has the product ID with an unique serial number etched in the standard.
Intended for reflected light microscopy, stereo microscopy, digital imaging systems and low magnification SEM applications. Example of Certificate of Traceability for Micro-Tec LCS-10 .
(More images)

LCS-10 Micro-Tec 10mm linear compound scale, 1, 0.1, 0.01mm div., Si/Cr, opaque
More Info
Product # Unit Price* Add to Quote / Cart
31-T33400-U LCS-10 Micro-Tec 10mm linear compound scale, 1, 0.1, 0.01mm div., Si/Cr, opaque, unmounted
Qty:

each €112,50
31-T33400-11 LCS-10 Micro-Tec 10mm linear compound scale, 1, 0.1, 0.01mm div., Si/Cr, opaque, mounted on a black metal slide
Qty:

each €122,50
31-T33400-10 LCS-10 Micro-Tec 10mm linear compound scale, 1, 0.1, 0.01mm div., Si/Cr, opaque, custom mounted
Qty:

each €212,50


    # 31-T33500   CCS-2.5 Micro-Tec 1inch cross scale, 0.001inch div., Si/Cr, opaque

CCS-2.5 Micro-Tec 1inch cross scale, 0.001inch div., Si/Cr, opaque The Micro-Tec CCS-2.5 is a 1 inch cross scale with 0.001 inch divisions. 75nm thick bright chrome lines on conductive ultra-flat silicon substrate. Useful for calibration application for US or inch based products. Die size is 3.5x3.5mm. Each calibration standard has the product ID with an unique serial number etched in the standard.
Intended for reflected light microscopy, stereo microscopy, digital imaging systems and low magnification SEM applications. Example of Certificate of Traceability for Micro-Tec CCS-2.5 .
(More images)

CCS-2.5 Micro-Tec 1inch cross scale, 0.001inch div., Si/Cr, opaque
More Info
Product # Unit Price* Add to Quote / Cart
31-T33500-U CCS-2.5 Micro-Tec 1inch cross scale, 0.001inch div., Si/Cr, opaque, unmounted
Qty:

each €49,50
31-T33500-11 CCS-2.5 Micro-Tec 1inch cross scale, 0.001inch div., Si/Cr, opaque, mounted on a black metal slide
Qty:

each €59,50
31-T33500-10 CCS-2.5 Micro-Tec 1inch cross scale, 0.001inch div., Si/Cr, opaque, custom mounted
Qty:

each €149,50

 

 




SEM Supplies

TEM Supplies

Calibration

Sample Preparation

AFM / SPM

  SEM Sample Stubs
  Sample Stub Adapters
  SEM Stage Adapters
  SEM Sample Holders
  Filaments/Cathodes
  Silicon Finder Grid
  Gatan 3View Pins
  FEI Volumescope Pins
  SEM Stub Storage Boxes
  Phenom Supplies
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  Hitachi TM series Supplies
  Field & lab sampler kits

Instruments


  Acoustic Enclosures
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  Cressington SEM Coaters
  HI-Res IR Chamberscope
  TEM Sample Prep
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  Grid Storage Boxes
  Cryo Grid Box
  TEM sample staining
  Filaments/Cathodes
  Cryo Pin for U-M
  Eyelash manipulators

FIB Supplies


  FIB Lift-out grids
  FIB low profile stubs
  FIB grid holders
  FIB pre-tilt holders
  FIB Grid Boxes
  SEM / FIB Magn. Calib.
  SEM Res. Test Spec.
  EDS / WDS Calibration
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  AFM / SPM Calibration
  LM Magn. Calibration

Vacuum Supplies


  Bullseye Vacuum Gauges
  D215V Vacuum Controller
  D801W Vacuum Gauges
  Quick-check Gauges
  KF/NW Vacuum Parts
  Vacuum oil and grease
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  Conductive Paint/Cement
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  Stainless Steel Mesh
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LM


  Correlative Cover Slips
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  Black metal slides
  Slide storage boxes
  Calibration
  Plastic Transfer Pipettes