EM-Tec low profile double pre-tilt pin stubs



Introduction

Pre-tilt pin stub are useful for FIB/SEM systems to get the sample perpendicular with the FIB column to allow for straight FIB milling in to the surface of the sample. The pre-tilt angles are complementary to the angles between the FIB column and the electron beam column. When pre-tilt stubs are used, there is no need to tilt the sample stage. Three types are available:

  • EM-Tec 52/38° low profile pre-tilt pin stub for TFS / FEI DualBeam FIB/SEM systems. Size w.o. pin is Ø12.7 x 6.9 mm.
  • EM-Tec 54/36° low profile pre-tilt pin stub with short pin for Zeiss CrossBeam systems. Size w.o. pin is Ø12.7 x 6.9 mm.
  • EM-Tec 55/35° low profile pre-tilt pin stub for TESCAN FIBxSEM systems. Size w.o. pin is Ø12.7 x 6.9 mm.

  • Specifications of the EM-Tec FIB low profile double pre-tilt pin stubs

    Product #

    Angle

    FIB/SEM

    Type

    Dimensions w/o pin

    10-002252

    52/38°

    TFS / FEI DualBean

    Ø12.7 mm pin stub

    Ø12.7 x 6.9 mm

    10-003254

    54/36°

    Zeiss CrossBeam

    Ø12.7 mm pin stub

    Ø12.7 x 6.9 mm

    10-002255

    55/35°

    Tescan FIBxSEM

    Ø12.7 mm pin stub

    Ø12.7 x 6.9 mm



    Ordering information for EM-Tec FIB low profile double pre-tilt pin stubs

    *Prices without VAT, but within the EU, we have to check for valid VAT-ID.
      
    EM-Tec low profile double pre-tilt (52°/38°) SEM pin stub Ø12.7 mm for FEI / TFS Dualbeam, aluminium EM-Tec low profile double pre-tilt (52°/38°) SEM pin stub Ø12.7 mm for FEI / TFS Dualbeam, aluminium
    Product # Unit Price* Add to Quote / Order
    10-002252 each €6,50
    Qty:

     

    EM-Tec low profile double pre-tilt (55°/35°) SEM pin stub Ø12.7 mm for Tescan FIBxSEM, aluminium EM-Tec low profile double pre-tilt (55°/35°) SEM pin stub Ø12.7 mm for Tescan FIBxSEM, aluminium
    Product # Unit Price* Add to Quote / Order
    10-002255 each €6,50
    Qty:

     

    EM-Tec low profile double pre-tilt (54°/36°) SEM pin stub Ø12.7 mm for Zeiss CrossBeam, short Zeiss pin, aluminium EM-Tec low profile double pre-tilt (54°/36°) SEM pin stub Ø12.7 mm for Zeiss CrossBeam, short Zeiss pin, aluminium
    Product # Unit Price* Add to Quote / Order
    10-003254 each €6,50
    Qty:

     



    SEM Supplies

    TEM Supplies

    Calibration

    Sample Preparation

    AFM / SPM

      Product Menu with Images
      SEM Sample Stubs
      Carbon Tabs
      Sample Stub Adapters
      SEM Stage Adapters
      SEM Sample Holders
      SEM Preparation Stands
      Filaments / Cathodes
      Silicon Finder Grid
      Gatan 3View Pins
      FEI Volumescope Pins
      SEM Stub Storage Boxes
      Phenom Supplies
      JEOL NeoScope Supplies
      Hitachi TM Series Supplies
      Field & Lab Sampler Kits
      FlowView liquid sample Kit

    Instruments

      Acoustic Enclosures
      Compact sputter coaters
      Cressington SEM coaters
      TEM Sample Prep
      Diaphragm Pump
      Rotary vacuum Pump
      Precision diamond saw  
      TEM Grids
      TEM Support Films
      Silicon Nitride Films
      K-Kit Wet Cell Holder
      Graphene Films
      TEM Grid Boxes
      Cryo Grid Boxes
      TEM Sample Staining
      3mm Embedding Tubes
      Filaments/Cathodes
      Eyelash Manipulators

    Cryo Supplies

      Cryo Grid Boxes
      Other Cryo Supplies

    FIB Supplies

      FIB Lift-out Grids
      FIB Low Profile Stubs
      FIB Grid Holders
      FIB Pre-tilt Holders
      FIB Pre-tilt stubs
      FIB Grid Boxes
      SEM / FIB Magn. Calib.
      SEM Res. Test Spec.
      EDS / WDS Calibration
      TEM Calibration
      AFM / SPM Calibration
      LM Magn. Calibration

    Vacuum Supplies

      Vacuum Gauges
      KF/NW Vacuum Parts
      KF/NW Vacuum Hoses
      Vacuum Oil and Grease
      Vacuum Sealant
      Diaphragm Pump
      Rotary vacuum Pump
      Vacuum Sample Storage
      Vacuum Pick-Up Pens

    Sample Coating Supplies

      Sputter Targets
      Carbon Rods & Fibers
      Quartz QCM Crystals
      SEM Sample Coating Fluid

    Evaporation Supplies

      Thermal Evaporation Sources
      Evaporation Materials
      Supports & Substrates
      SEM Preparation Stands
      Tweezers
      Probes & Picks
      Applicators & Swabs
      Plastic Transfer Pipettes
      Cutting Tools / Scissors
      Conductive Paint/Cement
      Conductive Tapes & Tabs
      Non-Conductive Adhesives
      Sample Storage
      Hand Tools
      Sorting Wire Mesh
      Preparation Surfaces
      Cleaning / Gloves
      Conductive Metal Powders
      Metallographic Sample Prep
      AFM/SPM Discs
      AFM/SPM Disc Pick-up Tool
      AFM/SPM Holders
      AFM/SPM Disc Storage
      Cantilever Tweezers
      AFM/SPM Discs Tweezers
      Nano-Tec Mica Discs
      HOPG Substrates

    Light Microscopy

      Correlative Cover Slips
      Glass Microscope Slides
      Glass Cover Slips
      Quartz Microscope Slides
      Quartz Cover Slips
      Black Metal Slides
      Slide Storage Boxes
      LM Calibration
      Plastic Transfer Pipettes
      Optical Lens Tissue
      Glass Petri Dishes
      PTFE Beakers