EM-Tec low profile double pre-tilt pin stubs
EM-Tec low profile double pre-tilt pin stubs
Introduction
Pre-tilt pin stub are useful for FIB/SEM systems to get the sample perpendicular with the FIB column to allow for straight FIB milling in to the surface of the sample. The pre-tilt angles are complementary to the angles between the FIB column and the electron beam column. When pre-tilt stubs are used, there is no need to tilt the sample stage. Three types are available:
Specifications of the EM-Tec FIB low profile double pre-tilt pin stubs
|
Product # |
Angle |
FIB/SEM |
Type |
Dimensions w/o pin |
|
10-002252 |
52/38° |
TFS / FEI DualBean |
Ø12.7 mm pin stub |
Ø12.7 x 6.9 mm |
|
10-003254 |
54/36° |
Zeiss CrossBeam |
Ø12.7 mm pin stub |
Ø12.7 x 6.9 mm |
|
10-002255 |
55/35° |
Tescan FIBxSEM |
Ø12.7 mm pin stub |
Ø12.7 x 6.9 mm |
Ordering information for EM-Tec FIB low profile double pre-tilt pin stubs
*Prices without VAT, but within the EU, we have to check for valid VAT-ID.
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