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EM-Tec LAMC-15 large area magnification calibration standards
ideal for low magnifications, large areas, microscope stages and digital imaging systems



       EM-Tec LAMC-15 large area maginfication calibration standard
Introduction

The unique EM-Tec LAMC-15 calibration standard has been designed for large area and low magnification calibration. It is constructed using an ultra-flat conductive silicon substrate with bright chromium deposited lines. Ideal for SEM and reflected light microscopy with the following applications:

  • low magnification calibration
  • large area magnification calibration
  • particle analysis measurements
  • GSR measurements
  • microscope stage linearity and reproducibility measurements
  • digital imaging systems

The EM-Tec LAMC-15 is useful in the 5-1000x magnification range. The patterns on this calibration standard are:

  • cross grating of 15x15mm with 0.01mm divisions
  • 15mm grating lines with 0.01mm divisions on opposite ends
  • cross hairs at each 0.1mm interval
  • larger cross hairs at each 1mm interval

The cross hairs allow for easy navigation and for testing the linearity of both low magnification imaging and the backlash on a (motorised) microscope stage. The deposited Cr lines are in the same focus plane as the substrate, are better defined and provide more signal than etched patterns. They are also less prone to accumulate dust particles in the patterns. Each of the calibration standards has a unique product ID serial number etched on the die. Available as unmounted or mounted on popular SEM sample stubs or black metal slide. Use an EM-Tec SEM stub adapter if you wish to use this calibration standard on multiple SEM platforms. The EM-Tec LAMC-15 is a NIST traceable magnification calibration standard. Example of wafer level certificate of traceability which is supplied with each Em-Tec LAMC-15.


Specifications for the EM-Tec LAMC-15 large area magnification calibration standard

Substrate 525µm thick boron doped ultra-flat wafer with <100> orientation
Conductive  Excellent; 5-10 Ohm resistivity
Patterns  Graticules, lines and fiducials
Pattern size 15 x 15mm
Lines  75nm thick, pure bright chromium lines
Divisions 0.01mm, 0.1mm and 1.0mm
Die size 17 x 17mm
Application   SEM, Reflective light, stereo microscopes, optical imaging systems
Identification Product ID with serial number etched
Mounting  Unmounted, mounting optionally available
Supplied Supplied in a Gel-Pak box


Ordering Information

*Prices are without tax. Tax might be added in cart.

EM-Tec LAMC-15 Large area magnification calibration standard EM-Tec LAMC-15 Large area magnification calibration standard

Product # Unit Price* Add to Quote / Cart
31-T33000-U EM-Tec LAMC-15 Large area magnification calibration standard, unmounted
Qty:

each €265,00
31-T33000-3 EM-Tec LAMC-15 Large area magnification calibration standard, mounted on 25.4mm pin stub
Qty:

each €275,00
31-T33000-7 EM-Tec LAMC-15 Large area magnification calibration standard, mounted op 25mm JEOL stub
Qty:

each €275,00
31-T33000-9 EM-Tec LAMC-15 Large area magnification calibration standard, mounted on 25mm Hitachi stub
Qty:

each €275,00
31-T33000-11 EM-Tec LAMC-15 Large area magnification calibration standard, mounted on black microscope slide
Qty:

each €275,00
31-T33000-10 EM-Tec LAMC-15 Large area magnification calibration standard, mounted on custom specimen stub
Qty:

each €365,00




SEM Supplies

TEM Supplies

Calibration

Sample Preparation

AFM / SPM

  SEM Sample Stubs
  Sample Stub Adapters
  SEM Stage Adapters
  SEM Sample Holders
  SEM Preparation Stands
  Filaments/Cathodes
  Silicon Finder Grid
  Gatan 3View Pins
  FEI Volumescope Pins
  SEM Stub Storage Boxes
  Phenom Supplies
  JEOL NeoScope Supplies
  Hitachi TM series Supplies
  Field & lab sampler kits

Instruments


  Acoustic Enclosures
  Critical Point Dryers
  Cressington SEM Coaters
  HI-Res IR Chamberscope
  TEM Sample Prep
  TEM Grids
  TEM Support Films
  Graphene Films
  Grid Storage Boxes
  Cryo Grid Box
  TEM sample staining
  Filaments/Cathodes
  Cryo Pin for U-M
  Eyelash manipulators

FIB Supplies


  FIB Lift-out grids
  FIB low profile stubs
  FIB grid holders
  FIB pre-tilt holders
  FIB Grid Boxes
  SEM / FIB Magn. Calib.
  SEM Res. Test Spec.
  EDS / WDS Calibration
  TEM Calibration
  AFM / SPM Calibration
  LM Magn. Calibration

Vacuum Supplies


  Bullseye Vacuum Gauges
  D215V Vacuum Controller
  D801W Vacuum Gauges
  Quick-check Gauges
  KF/NW Vacuum Parts
  Vacuum oil and grease
  Vacuum sample storage
  Evaporation baskets
  Quartz QCM Crystals
  Sputter Targets
  Carbon Rods & Fibers
  Quartz QCM Crystals
  Supports & Substrates
  SEM Preparation Stands
  Tweezers
  Probes & Picks
  Cryo Jug & Container
  Applicators & Swabs
  Plastic Transfer Pipettes
  Cutting Tools / Scissors
  Conductive Paint/Cement
  Conductive Tapes &Tabs
  Non-conductive Adhesives
  Stainless Steel Mesh
  Sample Storage
  Tools
  Preparation mats & tiles
  Cleaning / Gloves
  Diamond Polishing Paste
  AFM/SPM Discs
  AFM/SPM Holders
  AFM/SPM Disc Storage
  Cantilever Tweezers
  AFM/SPM Discs Tweezers
  Mica Discs
  HOPG Substrates


LM


  Correlative Cover Slips
  Glass Microscope Slides
  Glass Cover Slips
  Quartz Microscope Slides
  Quartz Cover Slips
  Black metal slides
  Slide storage boxes
  Calibration
  Plastic Transfer Pipettes